Focus on spectral sensing and optoelectronic application systems
The LS-LD-IRR10-LF type laser life aging device developed by LiSen Optics is a laboratory aging device used to test the lifespan of lasers. This device allows for the setting of the test laser's driving current, operating temperature, and the number of data collection points or frequency. Based on testing needs, the laser under test is set under constant working conditions (e.g., I=500mA, T=80°C), and the relative optical power P of the laser is monitored in real-time over time t, thereby drawing the high-temperature accelerated aging curve (P-t curve) of the test laser. Based on the principle of accelerated life testing, the lifespan of the laser under test under normal working conditions (e.g., T=25°C) is calculated using the aging failure formula.
The LS-LD-IRR10-LF type laser life aging device developed by LiSen Optics is a laboratory aging device used to test the lifespan of lasers. This device allows for the setting of the test laser's driving current, operating temperature, and the number of data collection points or frequency. Based on testing needs, the laser under test is set under constant working conditions (e.g., I=500mA, T=80°C), and the relative optical power P of the laser is monitored in real-time over time t, thereby drawing the high-temperature accelerated aging curve (P-t curve) of the test laser. Based on the principle of accelerated life testing, the lifespan of the laser under test under normal working conditions (e.g., T=25°C) is calculated using the aging failure formula.
Main Technical Features
● Can measure up to 10 lasers simultaneously.
● Series drive with a maximum current of up to 20A.
● Customized fixture platform with adjustable XYZ axes.
● High-power semiconductor temperature controller for precise temperature control.
● Fully automated data monitoring software, real-time recording of relative optical power changes over time.
Main Technical Features
● Can measure up to 10 lasers simultaneously.
● Series drive with a maximum current of up to 20A.
● Customized fixture platform with adjustable XYZ axes.
● High-power semiconductor temperature controller for precise temperature control.
● Fully automated data monitoring software, real-time recording of relative optical power changes over time.
Technical Principle
Testing Function |
P-t curve |
Temperature Control Range |
5℃~+85℃ |
Temperature Control Accuracy |
±1℃ |
Drive Method |
Series, constant current mode |
Drive Current |
Default 3A (up to 20A max), resolution 1μA, accuracy 0.05% |
Power Probe |
Response wavelength 400-1100nm, measurement range 1mW to 100W |
Sample Fixture |
Customized based on laser size, precise positioning, adjustable in X, Y, Z axes |
Software Features |
Can set current, temperature, sampling frequency, fully automatic data recording, automatic lifespan calculation. |
Technical Principle
Testing Function |
P-t curve |
Temperature Control Range |
5℃~+85℃ |
Temperature Control Accuracy |
±1℃ |
Drive Method |
Series, constant current mode |
Drive Current |
Default 3A (up to 20A max), resolution 1μA, accuracy 0.05% |
Power Probe |
Response wavelength 400-1100nm, measurement range 1mW to 100W |
Sample Fixture |
Customized based on laser size, precise positioning, adjustable in X, Y, Z axes |
Software Features |
Can set current, temperature, sampling frequency, fully automatic data recording, automatic lifespan calculation. |