The LS-VCS-SCI-LIV research-grade multifunctional LIV spectral power integration test system was developed by Lisen Optics specifically for 3D-SENSING based pulsed laser/LD laser LIV spectral testing, especially for wafer and module packaging users to use in the laboratory for VCSEL/LD research and development, to verify the VCSEL/LD photovoltaic process of each process characteristics of VCSEL/LD processes. It is used to verify the optoelectronic characteristics of VCSELs/LDs in various processes. It enables the measurement of LIV, EIV, TIE, PCE, spectral wavelength and power of VCSELs/LDs monoliths, modules and chips.

LS-VCS-SCI-LIV research grade multifunctional spectral power integration test system is specially developed for 3D-SENSING based pulsed laser, pulsed LD/LED test, which can be used for VCSEL, LD/LED photoelectric characteristics testing to ensure that VCSEL, LD/LED pulsed laser radiation spectrum to meet the device optical function and IEC-60825-2 laser safety - human eye safety application requirements.

Main Functional Features

● Powerful special software analysis function, can scan and measure LIV curve, PCE curve, temperature-peak wavelength-optical power curve, can set scanning accuracy and speed, can measure photoelectric conversion efficiency, automatically save test data.

● High precision spectrometer spectral ranges 200-1700nm optional, spectral resolution 0.1nm (800-1000nm), to achieve peak wavelength and FWHM measurement, the fastest 2kHz sampling rate, can scan the measurement of temperature - peak wavelength - power curve, etc.

● Manual or fully automated probe stage for automated LIV spectral power testing of wafers or modules.

● Precise temperature control of samples, settable scan steps, high-speed simultaneous triggering, preset/custom measurements.

● Multi-thread linkage (high-power high-precision current source, high-precision high-speed digital multimeter, multi-channel synchronous digital multimeter, power detector, spectrometer, temperature controller, etc.) can realize programmed and automated scanning measurement of spectra, power, current, temperature and other parameters.

● Integrated industrial control chassis, high-resolution LCD display, automated integrated operation software.

● Adopt four-line measurement method, real-time record of measured current, voltage value, power value, more accurate test

● Program can be set to continuous and pulse scanning mode.

● Life aging detection function (optional): Under constant or pulsed conditions (current, temperature), spectral and power data are recorded at specified time intervals.

Spectral Demonstrate Software’s UI

Test Data

Data Analysis’s UI

Main Technical Indicators