Focus on spectral sensing and optoelectronic application systems
The LiSpec-UVIR series of wide-spectral ultraviolet-visible-near-infrared spectrometers from LiSen Optics is a revolutionary miniaturized spectrometer with an imported core spectral module. Its control circuit employs unique micro-processing technology, enabling dual-channel synchronous measurement. This technology truly realizes full-spectrum measurement from 200 to 2500 nm. For the range of 200-1000 nm, it uses a 2048-pixel BT-CCD array detector with an ultraviolet-visible quantum efficiency of 85%. For 900-1700 nm and 1000-2500 nm, it utilizes large-target cooled linear array InGaAs detectors with 256 and 512 pixels respectively, offering a wide dynamic range and high sensitivity. Additionally, unique infrared thermal pixel drift calibration ensures minimal influence from external thermal environments on the infrared spectrum, resulting in more stable test data.
The LiSpec-UVIR series of wide-spectral ultraviolet-visible-near-infrared spectrometers from LiSen Optics is a revolutionary miniaturized spectrometer with an imported core spectral module. Its control circuit employs unique micro-processing technology, enabling dual-channel synchronous measurement. This technology truly realizes full-spectrum measurement from 200 to 2500 nm. For the range of 200-1000 nm, it uses a 2048-pixel BT-CCD array detector with an ultraviolet-visible quantum efficiency of 85%. For 900-1700 nm and 1000-2500 nm, it utilizes large-target cooled linear array InGaAs detectors with 256 and 512 pixels respectively, offering a wide dynamic range and high sensitivity. Additionally, unique infrared thermal pixel drift calibration ensures minimal influence from external thermal environments on the infrared spectrum, resulting in more stable test data.
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LiSpec-UVIR Series With Integrating Sphere |
LiSpec-UVIR Seires With Cosine Probe |
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LiSpec-UVIR Series With Integrating Sphere |
LiSpec-UVIR Seires With Cosine Probe |
Main Technical Indicators
Model |
LiSpec-Mini-UVIR-1.7 |
LiSpec-UVIR-1.7TEC(Pro) |
LiSpec-UVIR-2.5TEC(Pro) |
Optical Platform |
Symmetric Czerny-Turner |
Symmetric Czerny-Turner |
Symmetric Czerny-Turner |
Spectral Range |
200-1700 nm |
200-1700 nm |
200-2500 nm |
Optical Resolution (FWHM) |
3~10 nm |
4-15 nm |
12-30 nm |
Wavelength Accuracy |
≤±0.5 nm |
≤±0.3 nm |
≤±0.8 nm |
Stray Light |
<0.3% |
<0.2% |
<0.45% |
Detector |
Linear Array 1024 Pixel CMOS |
Array 2048 Pixel BT-CCD, Cooled Linear Array 256/512 Pixel InGaAs |
Array 2048 Pixel BT-CCD, Cooled Linear Array 256/512 Pixel InGaAs |
Signal-to-Noise Ratio |
350:01:00 |
3300/3000 (HS), 5500/3500 (LN) |
1600 (HS), 3500 (LN) |
Dynamic Range |
3500:01:00 |
7000 (HS), 9500 (LN) |
5900 (HS), 9300 (LN) |
Dark Noise (RMS) |
20 counts |
14 counts (HS), 10 counts (LN) |
15 counts (HS), 10 counts (LN) |
Cooling Temperature |
None |
-25℃ (relative to ambient) |
-55℃ (relative to ambient) |
AD Conversion |
16-bit, 15 MHz |
16-bit, 15 MHz |
16-bit, 15 MHz |
Integration Time |
100μs-24s |
100us-24s (HS), 100us-24s (LN) |
100us-20ms (HS), 100us-200ms (LN) |
Communication Interface |
USB2.0 / 8pin GPIO |
USB2.0 / 8pin GPIO |
USB2.0 / 8pin GPIO |
I/O Interface |
USB2.0 / 8pin GPIO |
USB2.0 / 8pin GPIO |
USB2.0 / 8pin GPIO |
Power Supply |
500mA/5 VDC, USB Powered |
350mA / 5V DC; Cooling socket: 1300mA / 5VDC |
480mA / 5VDC; Cooling socket: 2200mA / 5VDC |
Operating Temperature |
0-55℃ |
0-50℃ |
0-50℃ |
Dimensions |
51x36x29 mm |
130x96x58 mm |
130x96x58 mm |
Main Technical Indicators
Model |
LiSpec-Mini-UVIR-1.7 |
LiSpec-UVIR-1.7TEC(Pro) |
LiSpec-UVIR-2.5TEC(Pro) |
Optical Platform |
Symmetric Czerny-Turner |
Symmetric Czerny-Turner |
Symmetric Czerny-Turner |
Spectral Range |
200-1700 nm |
200-1700 nm |
200-2500 nm |
Optical Resolution (FWHM) |
3~10 nm |
4-15 nm |
12-30 nm |
Wavelength Accuracy |
≤±0.5 nm |
≤±0.3 nm |
≤±0.8 nm |
Stray Light |
<0.3% |
<0.2% |
<0.45% |
Detector |
Linear Array 1024 Pixel CMOS |
Array 2048 Pixel BT-CCD, Cooled Linear Array 256/512 Pixel InGaAs |
Array 2048 Pixel BT-CCD, Cooled Linear Array 256/512 Pixel InGaAs |
Signal-to-Noise Ratio |
350:01:00 |
3300/3000 (HS), 5500/3500 (LN) |
1600 (HS), 3500 (LN) |
Dynamic Range |
3500:01:00 |
7000 (HS), 9500 (LN) |
5900 (HS), 9300 (LN) |
Dark Noise (RMS) |
20 counts |
14 counts (HS), 10 counts (LN) |
15 counts (HS), 10 counts (LN) |
Cooling Temperature |
None |
-25℃ (relative to ambient) |
-55℃ (relative to ambient) |
AD Conversion |
16-bit, 15 MHz |
16-bit, 15 MHz |
16-bit, 15 MHz |
Integration Time |
100μs-24s |
100us-24s (HS), 100us-24s (LN) |
100us-20ms (HS), 100us-200ms (LN) |
Communication Interface |
USB2.0 / 8pin GPIO |
USB2.0 / 8pin GPIO |
USB2.0 / 8pin GPIO |
I/O Interface |
USB2.0 / 8pin GPIO |
USB2.0 / 8pin GPIO |
USB2.0 / 8pin GPIO |
Power Supply |
500mA/5 VDC, USB Powered |
350mA / 5V DC; Cooling socket: 1300mA / 5VDC |
480mA / 5VDC; Cooling socket: 2200mA / 5VDC |
Operating Temperature |
0-55℃ |
0-50℃ |
0-50℃ |
Dimensions |
51x36x29 mm |
130x96x58 mm |
130x96x58 mm |
Dimension Drawing (Unit: mm)
Typical Application
● Raman Spectroscopy Measurement
The Raman measurement system mainly consists of a spectrometer, a laser, a Raman probe, and Raman identification spectrum analysis software. Raman scattering is primarily Stokes and anti-Stokes, with Stokes Raman scattering usually much stronger than anti-Stokes scattering. Raman spectrometers typically measure Stokes scattering. Commonly used Raman spectrometers include 532/785/1064 Raman spectrometers. Raman measurements are generally an order of magnitude weaker than fluorescence signals. For weak Raman signal measurements, Surface-Enhanced Raman Scattering (SERS) is employed to amplify the Raman signal. LiSen Optics' LiSpec-UV series of industrial high-speed spectrometers, with their high sensitivity and high signal-to-noise ratio, can be paired with lasers and Raman probes to measure weak spectral signals, widely used in food safety, chemical laboratories, biology, and medical optics for the determination and confirmation of substance composition. They are also applicable in forensics for drug detection and in the jewelry industry for gemstone identification.
● Color Measurement
The color of an object can be described by the CIE1976 (Lab*) color space. L* represents the brightness of the color, positive a* values represent red, negative a* values represent green, hue, and chroma. Similarly, positive b* values represent yellow, and negative b* values represent blue. Lab* values can be derived from the CIE tristimulus values X, Y, Z of the sample (object) and the tristimulus values Xn, Yn, Zn of the standard light source. The tristimulus values X, Y, Z of an object's color are obtained by multiplying the relative power P of the standard light source, the reflectance R (or transmittance T) of the object, and the CIE standard observer functions Xλ,yλ,zλ (for 2 or 10-degree fields). Integrating these values over the visible spectrum range (from 380 to 780 nm, at 5 nm intervals) yields the tristimulus values. Professional color measurement software can compare the measured Lab* values with reference colors to calculate the color difference(△Elab,△L*,△a*,△b*).
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● Radiation Measurement
Radiant light energy can be quantified as radiant flux, which is a standard measure of the energy radiated per second (W) from a light source. Radiation measurements generally require absolute radiometric calibration of the spectrometer system with a standard light source of known spectral energy distribution. This calibration allows for radiation measurements through quantifiable parameters. Radiation energy related to human vision (photometry) can obtain the spectral luminous efficiency functions defined by the CIE, which represent the average vision of observers. Therefore, radiometric parameters, photometric parameters, and colorimetric parameters are defined in radiation measurement. Radiometric parameters mainly include irradiance μW/cm², radiance µWatt/sr, radiant flux µWatt, and photon count µMol/s/m², µMol/m², µMol/s, and µMol. Photometric parameters include lumens, illuminance Lux, and intensity Candela. Colorimetric parameters include X, Y, Z, x, y, z, u, v, color temperature, CRI color rendering index, etc.
● Irradiance Measurement
● LED Color Measurement
● Absorbance Measurement
The method of measuring absorbance with a spectrometer involves passing parallel light of a certain wavelength through a flat parallel sample and detecting the light transmitted through the sample. Since a portion of the energy is absorbed by molecules in the sample, the intensity of the detected incident light is higher than that transmitted through the sample. Absorbance is widely used in spectral measurement techniques for liquids and gases for quantitative identification of substances or fingerprint authentication. It can also be integrated into industrial applications and tests of interest to customers. Using LiSen Optics' modular spectrometers, specific absorbance measurements can be selected based on different wavelength ranges and resolutions. In the lab or field, the entire optical measurement setup can be quickly configured. Based on the high-quality spectrometers from LiSen Optics, a flexible and easy-to-use combination can be made by choosing UV light sources, different optical path gas chambers, absorption cells, specific absorption path modules, and fiber probes, offering a variety of configuration options for different absorbance test
● Liquid Absorbance
Absorbance Measurement (Cuvette)
Absorbance Measurement (Fiber Probe)
● Gas Absorbance
● Thin Film Measurement
Thin film measurement systems are based on the principle of white light interferometry to determine the thickness of optical thin films. The thickness of the film is calculated through mathematical functions applied to the white light interference patterns. For a single-layer film, the physical thickness can be calculated if the refractive index (n) and extinction coefficient (k) of the film medium are known. The measurable film thickness ranges from 10 nm to 50 µm, with a resolution of up to 1 nm. Thin film measurement is applied in the semiconductor chip production industry, where it is necessary to monitor plasma etching and deposition processes. It can also be used in other fields requiring measurement of transparent film layers deposited on metal and glass substrates, such as transparent coatings on metal surfaces and glass substrates.
● Transmission/Reflection Spectral Measurement
With the booming industrial development, the quality control of the material characteristics has become increasingly strict. The technology of rapid and accurate transmission/reflection spectral measurements using fiber optic spectrometers is becoming more mature. Transmission/reflection spectral measurement is a basic method of spectral measurement, typically requiring equipment such as a spectrometer, light source, optical fiber, measurement stand, standard reference samples, and measurement software. To obtain better spectral data from different types of samples, these two basic modes may evolve into many more forms. Fiber optic spectrometers use optical fiber paths, overcoming the limitations of optical paths in instrument integration. LiSen Optics' fiber optic spectrometers are characterized by their small size, high stability, support for secondary software development, and a rich array of accessories, and have been successfully applied in the testing of industries such as glass and polymer materials. LiSen Optics provides users with spectral measurement equipment centered around spectrometers, and with these richly configured devices, various common spectral measurement systems can be easily set up.
Dimension Drawing (Unit: mm)
Typical Application
● Raman Spectroscopy Measurement
The Raman measurement system mainly consists of a spectrometer, a laser, a Raman probe, and Raman identification spectrum analysis software. Raman scattering is primarily Stokes and anti-Stokes, with Stokes Raman scattering usually much stronger than anti-Stokes scattering. Raman spectrometers typically measure Stokes scattering. Commonly used Raman spectrometers include 532/785/1064 Raman spectrometers. Raman measurements are generally an order of magnitude weaker than fluorescence signals. For weak Raman signal measurements, Surface-Enhanced Raman Scattering (SERS) is employed to amplify the Raman signal. LiSen Optics' LiSpec-UV series of industrial high-speed spectrometers, with their high sensitivity and high signal-to-noise ratio, can be paired with lasers and Raman probes to measure weak spectral signals, widely used in food safety, chemical laboratories, biology, and medical optics for the determination and confirmation of substance composition. They are also applicable in forensics for drug detection and in the jewelry industry for gemstone identification.
● Color Measurement
The color of an object can be described by the CIE1976 (Lab*) color space. L* represents the brightness of the color, positive a* values represent red, negative a* values represent green, hue, and chroma. Similarly, positive b* values represent yellow, and negative b* values represent blue. Lab* values can be derived from the CIE tristimulus values X, Y, Z of the sample (object) and the tristimulus values Xn, Yn, Zn of the standard light source. The tristimulus values X, Y, Z of an object's color are obtained by multiplying the relative power P of the standard light source, the reflectance R (or transmittance T) of the object, and the CIE standard observer functions Xλ,yλ,zλ (for 2 or 10-degree fields). Integrating these values over the visible spectrum range (from 380 to 780 nm, at 5 nm intervals) yields the tristimulus values. Professional color measurement software can compare the measured Lab* values with reference colors to calculate the color difference(△Elab,△L*,△a*,△b*).
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● Radiation Measurement
Radiant light energy can be quantified as radiant flux, which is a standard measure of the energy radiated per second (W) from a light source. Radiation measurements generally require absolute radiometric calibration of the spectrometer system with a standard light source of known spectral energy distribution. This calibration allows for radiation measurements through quantifiable parameters. Radiation energy related to human vision (photometry) can obtain the spectral luminous efficiency functions defined by the CIE, which represent the average vision of observers. Therefore, radiometric parameters, photometric parameters, and colorimetric parameters are defined in radiation measurement. Radiometric parameters mainly include irradiance μW/cm², radiance µWatt/sr, radiant flux µWatt, and photon count µMol/s/m², µMol/m², µMol/s, and µMol. Photometric parameters include lumens, illuminance Lux, and intensity Candela. Colorimetric parameters include X, Y, Z, x, y, z, u, v, color temperature, CRI color rendering index, etc.
● Irradiance Measurement
● LED Color Measurement
● Absorbance Measurement
The method of measuring absorbance with a spectrometer involves passing parallel light of a certain wavelength through a flat parallel sample and detecting the light transmitted through the sample. Since a portion of the energy is absorbed by molecules in the sample, the intensity of the detected incident light is higher than that transmitted through the sample. Absorbance is widely used in spectral measurement techniques for liquids and gases for quantitative identification of substances or fingerprint authentication. It can also be integrated into industrial applications and tests of interest to customers. Using LiSen Optics' modular spectrometers, specific absorbance measurements can be selected based on different wavelength ranges and resolutions. In the lab or field, the entire optical measurement setup can be quickly configured. Based on the high-quality spectrometers from LiSen Optics, a flexible and easy-to-use combination can be made by choosing UV light sources, different optical path gas chambers, absorption cells, specific absorption path modules, and fiber probes, offering a variety of configuration options for different absorbance test
● Liquid Absorbance
Absorbance Measurement (Cuvette)
Absorbance Measurement (Fiber Probe)
● Gas Absorbance
● Thin Film Measurement
Thin film measurement systems are based on the principle of white light interferometry to determine the thickness of optical thin films. The thickness of the film is calculated through mathematical functions applied to the white light interference patterns. For a single-layer film, the physical thickness can be calculated if the refractive index (n) and extinction coefficient (k) of the film medium are known. The measurable film thickness ranges from 10 nm to 50 µm, with a resolution of up to 1 nm. Thin film measurement is applied in the semiconductor chip production industry, where it is necessary to monitor plasma etching and deposition processes. It can also be used in other fields requiring measurement of transparent film layers deposited on metal and glass substrates, such as transparent coatings on metal surfaces and glass substrates.
● Transmission/Reflection Spectral Measurement
With the booming industrial development, the quality control of the material characteristics has become increasingly strict. The technology of rapid and accurate transmission/reflection spectral measurements using fiber optic spectrometers is becoming more mature. Transmission/reflection spectral measurement is a basic method of spectral measurement, typically requiring equipment such as a spectrometer, light source, optical fiber, measurement stand, standard reference samples, and measurement software. To obtain better spectral data from different types of samples, these two basic modes may evolve into many more forms. Fiber optic spectrometers use optical fiber paths, overcoming the limitations of optical paths in instrument integration. LiSen Optics' fiber optic spectrometers are characterized by their small size, high stability, support for secondary software development, and a rich array of accessories, and have been successfully applied in the testing of industries such as glass and polymer materials. LiSen Optics provides users with spectral measurement equipment centered around spectrometers, and with these richly configured devices, various common spectral measurement systems can be easily set up.
● Reflectance Measurement
Reflectance Measurement(Probe)
Reflectance Measurement (Integrating Sphere)
● Transmittance Measurement
● Fluorescence Spectral Measurement
Fluorescent substances emit radiation with a certain spectral distribution under the radiation energy of specific wavelengths, usually scattering energy radiation in all directions. The fluorescence energy generated in fluorescence spectral measurement is less than the energy of the photons of the excitation light, only about 3% of the excitation light energy. It has high sensitivity, strong selectivity, requires small sample quantities, is simple to use, and is environmentally friendly. It is widely used in engineering applications such as monitoring food safety in food processing, fluorescence diagnosis of lesions in biomedical applications, exploration of oil minerals in geology, determination of soil mineral composition, and detection of trace elements in substances. LiSen Optics' fiber optic spectrometers feature interchangeable slits, selectable wavelength ranges, and resolution design, allowing customers to freely configure and match the fluorescence measurement system with suitable parameters according to their needs.
Fluorescence Measurement (Liquid)
Fluorescence Measurement (Powder, Solid)
● Reflectance Measurement
Reflectance Measurement(Probe)
Reflectance Measurement (Integrating Sphere)
● Transmittance Measurement
● Fluorescence Spectral Measurement
Fluorescent substances emit radiation with a certain spectral distribution under the radiation energy of specific wavelengths, usually scattering energy radiation in all directions. The fluorescence energy generated in fluorescence spectral measurement is less than the energy of the photons of the excitation light, only about 3% of the excitation light energy. It has high sensitivity, strong selectivity, requires small sample quantities, is simple to use, and is environmentally friendly. It is widely used in engineering applications such as monitoring food safety in food processing, fluorescence diagnosis of lesions in biomedical applications, exploration of oil minerals in geology, determination of soil mineral composition, and detection of trace elements in substances. LiSen Optics' fiber optic spectrometers feature interchangeable slits, selectable wavelength ranges, and resolution design, allowing customers to freely configure and match the fluorescence measurement system with suitable parameters according to their needs.
Fluorescence Measurement (Liquid)
Fluorescence Measurement (Powder, Solid)